This free collection is designed to foster good scientific practice, such as transparency and repeatability of experiments. It will not be updated with new data to ensure consistency of results.
|WPI Test Collection Patent Data from IFI CLAIMS|
|Authorities:||China, EPO, Japan, Korea, United States, WIPO|
|Type of documents:||Patent applications and grants, no utility models|
|Time period:||Publication years 2014 and 2015|
|Language:||Original full text – no machine translations to English|
|Beyond text:||All referenced images or files|
Previous versions of the collection then known as Marec covered only one vertical (one subject or patent authority) over many years. This dataset includes all domains from major patent authorities over a two year period.
Learn more about the WPI Test Collection in this article published by the World Patent Information Journal.
Qualified users can request access on the Zenodo repository webpage.