IFI Patent Data Available through the WPI Test Collection

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A subset of IFI patent data is now available for research purposes in conjunction with the World Patent Information (WPI) journal. The collection supports the mission of WPI, which is to publish insights into intellectual property information retrieval along with patent analytics methods.
This free collection is designed to foster good scientific practice, such as transparency and repeatability of experiments. It will not be updated with new data to ensure consistency of results.
WPI Test Collection Patent Data from IFI CLAIMS
Authorities: China, EPO, Japan, Korea, United States, WIPO
Type of documents: Patent applications and grants, no utility models
Time period: Publication years 2014 and 2015
Language: Original full text – no machine translations to English
Beyond text: All referenced images or files

Previous versions of the collection then known as Marec covered only one vertical (one subject or patent authority) over many years. This dataset includes all domains from major patent authorities over a two year period.
Learn more about the WPI Test Collection in this article published by the World Patent Information Journal.
Qualified users can request access on the Zenodo repository webpage.